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Classification of microarray data with penalized logistic regression

  • P. H.C. Eilers
  • , J. M. Boer
  • , G. J. Van Ommen
  • , H. C. Van Houwelingen

Research output: Contribution to journalConference articlepeer-review

45 Citations (Scopus)

Abstract

Classification of microarray data needs a firm statistical basis. In principle, logistic regression can provide it, modeling the probability of membership of a class with (transforms of) linear combinations of explanatory variables. However, classical logistic regression does not work for microarrays, because generally there will be far more variables than observations. One problem is multicollinearity: estimating equations become singular and have no unique and stable solution. A second problem is over-fitting: a model may fit well to a data set, but perform badly when used to classify new data. We propose penalized likelihood as a solution to both problems. The values of the regression coefficients are constrained in a similar way as in ridge regression. All variables play an equal role, there is no ad-hoc selection of most "relevant" or "most expressed" genes. The dimension of the resulting systems of equations is equal to the number of variables, and generally will be too large for most computers, but it can dramatically be reduced with the singular value decomposition of some matrices. The penalty is optimized with AIC (Akaike's Information Criterion), which essentially is a measure of prediction performance. We find that penalized logistic regression performs well on a public data set (the MIT ALL/AML data).

Original languageEnglish
Pages (from-to)187-198
Number of pages12
JournalProceedings of SPIE - The International Society for Optical Engineering
Volume4266
DOIs
Publication statusPublished - 2001
Externally publishedYes
EventMicroarrays: Optical Technologies and Informatics - San Jose, CA, United States
Duration: 21 Jan 200022 Jan 2000

Keywords

  • AIC
  • Cross-validation
  • Generalized linear models
  • Genetic expression
  • Multicollinearity
  • Multivariate calibration
  • Ridge regression
  • Singular value decomposition

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