Parameter estimation for the supercritical contact process

Marta Fiocco, Willem R. Van Zwet

Research output: Contribution to journalArticlepeer-review

7 Citations (Scopus)

Abstract

Contact processes - and, more generally, interacting particle processes - can serve as models for a large variety of statistical problems, especially if we allow some simple modifications that do not essentially complicate the mathematical treatment of these processes. We begin a statistical study of the supercritical contact process that starts with a single infected site at the origin and is conditioned on survival of the infection. We consider the statistical problem of estimating the parameter λ of the process on the basis of an observation of the process at a single time t. We propose an estimator of λ and show that it is consistent and asymptotically normal as t → ∞.

Original languageEnglish
Pages (from-to)1071-1092
Number of pages22
JournalBernoulli
Volume9
Issue number6
DOIs
Publication statusPublished - Dec 2003
Externally publishedYes

Keywords

  • Contact process
  • Parameter estimation
  • Random mask
  • Shrinking
  • Supercritical

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